This test measures the electrical
resistance on the portion of
the socket which is in the primary
current path. The resistance
is measured as shown in the
sketch. Note that secondary
parallel paths (i.e. contact
between probe tube and socket
bottom, probe tube and socket
top) if they occur, would lower
the resistance further.
Background
The distance between the clamp
contact points is the distance
from the probe retention indent
on the 100-SDS250M socket to
the socket bottom. For consistency,
the same distance is used for
all sockets tested even though
the probe retention indent is
closer to the bottom on other
sockets.
Test Materials
Qty
Part Number
Lot Number
25
100-SDG250W
lot
# 8008-16-01
25
100-SDH250W
lot
# 8008-16-03
25
100-SDN250W
lot
# 8040-16-02
25
100-SDS250M
lot
# 6352J RV A
1
Socket resistance test block per
sketch
1
Keithley 4-wire Micro-ohmmeter
Test Procedure
Each socket was loaded into the test
block and measured with 4-wire Micro-ohmmeter
as shown.
Results
The H tube sockets had the lowest resistance
followed by the G and the N tube, the
S tube had the highest resistance. See
table below for results.
Part
Number
Socket
Tube Material
Avg.
Res.*
100-SDH250W
High
Conductivity Alloy
.39
milliOhms
100-SDG250W
Gold
Plated Nickel Silver
1.48
milliOhms
100-SDN250W
Nickel-Silver
2.38
milliOhms
100-SDS250M
Stainless
Steel
7.06
milliOhms
*Resistance
measured from M tube probe retention
indent to socket tube bottom.
