Products

025-16 Series 039-16 Series 050-05 Series 050-16 Series 050-T25 Series 050-R25 Series 075-25 Series 075-40 Series 100-05 Series 100-16 Series 100-25 Series 100-40 Series 125-25 Series Double-Ended Sockets Interface Probes X Probe Socketless X39-25 Series X50-25 Series X50-40 Series X75-25 Series X75-40 Series IC Probe Series Tech Info

Application Notes
 
.075 and .100 inch centers, .400 inch stroke probes

QA Technology's 075-40 and 100-40 Series long-stroke probes are designed for use in dual-level (Functional/In-Circuit) test fixtures. The long-stroke probes are easily mixed with their standard-stroke counterparts from the 075-25 and 100-25 Series. Long-stroke and standard-stroke probes with the same center spacing install in identical sockets, mounted at the same set height. This allows the probes to be interchanged freely from one socket to another as test needs dictate.

Operating Positions

As shown above, the long-stroke probe tips are .150 [3.81] higher than neighboring standard-stroke tips when the fixture is not actuated. In the functional test position, the long-stroke probes are deflected .060 [1.52], leaving .090 [2.29] clearance to the tips of the standard-stroke probes. During in-circuit test, deflection of the long-stroke probes is .317 [8.05], and the standard-stroke probes are deflected .167 [4.24] (the recommended two-thirds travel position).